Carrier Generation Lifetimes in 4H-SiC MOS Capacitors

Published 2010 View Full Article

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Title
Carrier Generation Lifetimes in 4H-SiC MOS Capacitors
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 57, Issue 8, Pages 1910-1923
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-07-21
DOI
10.1109/ted.2010.2051196

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