Effects of Total Dose Irradiation on the Gate-Voltage Dependence of the $\hbox{1}/f$ Noise of nMOS and pMOS Transistors

Published 2009 View Full Article

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Title
Effects of Total Dose Irradiation on the Gate-Voltage Dependence of the $\hbox{1}/f$ Noise of nMOS and pMOS Transistors
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 57, Issue 2, Pages 503-510
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-12-09
DOI
10.1109/ted.2009.2036297

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