A New TDDB Reliability Prediction Methodology Accounting for Multiple SBD and Wear Out

Published 2009 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
A New TDDB Reliability Prediction Methodology Accounting for Multiple SBD and Wear Out
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 56, Issue 7, Pages 1424-1432
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-06-03
DOI
10.1109/ted.2009.2021810

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.