Degradation of the Reset Switching During Endurance Testing of a Phase-Change Line Cell

Published 2009 View Full Article

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Title
Degradation of the Reset Switching During Endurance Testing of a Phase-Change Line Cell
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 56, Issue 2, Pages 354-358
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-01-21
DOI
10.1109/ted.2008.2010568

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