Correlation of Charge Buildup and Stress-Induced Leakage Current in Cerium Oxide Films Grown on Ge (100) Substrates

Published 2009 View Full Article

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Title
Correlation of Charge Buildup and Stress-Induced Leakage Current in Cerium Oxide Films Grown on Ge (100) Substrates
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 56, Issue 3, Pages 399-407
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-02-26
DOI
10.1109/ted.2008.2011935

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