Channel Temperature Determination in High-Power AlGaN/GaN HFETs Using Electrical Methods and Raman Spectroscopy

Authors

Keywords

Journal

Volume 55, Issue 2, Pages 478-482

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2008-01-26

DOI

10.1109/ted.2007.913005

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started