Computational Study of the Ultimate Scaling Limits of CNT Tunneling Devices

Published 2008 View Full Article

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Title
Computational Study of the Ultimate Scaling Limits of CNT Tunneling Devices
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 55, Issue 1, Pages 313-321
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-01-05
DOI
10.1109/ted.2007.910563

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