Exploring the Capability of Multifrequency Charge Pumping in Resolving Location and Energy Levels of Traps Within Dielectric

Published 2008 View Full Article

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Title
Exploring the Capability of Multifrequency Charge Pumping in Resolving Location and Energy Levels of Traps Within Dielectric
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 55, Issue 12, Pages 3421-3431
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-11-26
DOI
10.1109/ted.2008.2006773

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