Size Dependence of Surface-Roughness-Limited Mobility in Silicon-Nanowire FETs

Published 2008 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Size Dependence of Surface-Roughness-Limited Mobility in Silicon-Nanowire FETs
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 55, Issue 11, Pages 2968-2976
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-11-12
DOI
10.1109/ted.2008.2005164

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.