Analysis of the Effects of Fringing Electric Field on FinFET Device Performance and Structural Optimization Using 3-D Simulation

Published 2008 View Full Article

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Title
Analysis of the Effects of Fringing Electric Field on FinFET Device Performance and Structural Optimization Using 3-D Simulation
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 55, Issue 5, Pages 1177-1184
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-04-29
DOI
10.1109/ted.2008.919308

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