Journal
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
Volume 21, Issue 3, Pages 3142-3145Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TASC.2010.2089670
Keywords
AC susceptibility; grained Bean model; pinning penetration field
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The main cause of the degradation in the oxide superconductors is considered to originate in the inter-granular link region among the superconducting grains. For analytical study of the granular structure, the grained Bean model is proposed, where the superconducting grains are immersed in the interconnecting link superconductors. Difference of the superconducting characteristics of the grain and the link, pinning penetration depths B(pg), B(pl) and grain volume factor f(g), introduces a variety of deformation on the AC susceptibility curves, such as double peaks in the imaginary part chi '' and plateaus in the real part chi'. From the dependence of chi' and chi '' of AC susceptibility on temperatures and DC magnetic fields B(dc) in grain-aligned Sm-123 superconductors, critical current densities, grain sizes and their anisotropic nature can be estimated and discussed comparing with the existing data.
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