Journal
IEEE PHOTONICS TECHNOLOGY LETTERS
Volume 30, Issue 20, Pages 1795-1798Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LPT.2018.2869423
Keywords
Talbot and self-imaging effects; X-ray imaging; X-ray interferometry
Funding
- National Natural Science Foundation of China [61405144]
- Natural Science Foundation of Tianjin, China [15JCQNJC42100]
- Technology Special Commissioner Project of Tianjin, China [16JCTPJC47200, 16JCTPJC48100]
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A new X-ray phase-contrast imaging on Talbot-Lau interferometer without phase-stepping device is proposed. A new analyzer grating is designed to replace the existing analyzer grating and scintillation conversion screen in the X-ray imaging system which is interlaced by the low-energy grid bars and the high-energy grid bars. Employing the new analyzer grating, the X-ray Talbot-Lau interferometer can obtain the differential phase-contrast image without the phase-stepping device by changing X-ray exposure energy only once. The simplified imaging system results in higher imaging efficiency and lower radiation dose. The experimental result shows that the imaging system can obtain a differential phase-contrast image of the specimen.
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