Journal
IEEE PHOTONICS TECHNOLOGY LETTERS
Volume 24, Issue 7, Pages 590-592Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LPT.2012.2184089
Keywords
Autocorrelation; optical interferometry; refractive index; ultrafast photonics
Funding
- Natural Science and Engineering Research Council of Canada (NSERC)
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An ultrafast refractometry technique is introduced for direct characterization of refractive indices, absorption coefficients, and refractive index variances in nanocomposite (NC) assemblies. The system samples bulk NC optical characteristics by probing phase delay, absorption, and spatial coherence effects on an ultrashort laser probe pulse. The integrated system is demonstrated for representative samples of 20-nm SiC nanoparticles in a polymer host and is found to successfully sample the desired optical characteristics.
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