How Low Can They Go?: Oscillator Phase Noise Model, Theoretical, Experimental Validation, and Phase Noise Measurements

Title
How Low Can They Go?: Oscillator Phase Noise Model, Theoretical, Experimental Validation, and Phase Noise Measurements
Authors
Keywords
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Journal
IEEE MICROWAVE MAGAZINE
Volume 14, Issue 6, Pages 50-72
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-08-31
DOI
10.1109/mmm.2013.2269859

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