Journal
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Volume 21, Issue 5, Pages 273-275Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LMWC.2011.2122303
Keywords
Frequency selective surfaces (FSSs); resonant dielectric measurement technique; waveguide filter
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A method to determine the dielectric permittivity of materials is presented. Such a method exploits the use of a low-cost frequency selective structure (FSS), transversally placed in a waveguide in the proximity of the sample under test. The presence of the additional dielectric placed close to the FSS leads to a shift of bandpass and bandstop resonance frequencies. The relationship between the frequency shift and the permittivity of the dielectric under test allows the determination of the unknown permittivity. Such a procedure is particularly suitable for measuring the dielectric permittivity of thin slabs.
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