An FRAM-Based Nonvolatile Logic MCU SoC Exhibiting 100% Digital State Retention at ${\rm VDD}=$ 0 V Achieving Zero Leakage With ${<}$ 400-ns Wakeup Time for ULP Applications

Title
An FRAM-Based Nonvolatile Logic MCU SoC Exhibiting 100% Digital State Retention at ${\rm VDD}=$ 0 V Achieving Zero Leakage With ${<}$ 400-ns Wakeup Time for ULP Applications
Authors
Keywords
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Journal
IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume 49, Issue 1, Pages 95-106
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-10-19
DOI
10.1109/jssc.2013.2284367

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