Combination of optical and X-ray techniques in the study of amorphous semiconductors under high pressure: an upgrade setup for combined XAS and XRD measurements

Published 2010 View Full Article

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Title
Combination of optical and X-ray techniques in the study of amorphous semiconductors under high pressure: an upgrade setup for combined XAS and XRD measurements
Authors
Keywords
-
Journal
HIGH PRESSURE RESEARCH
Volume 30, Issue 1, Pages 28-34
Publisher
Informa UK Limited
Online
2010-03-19
DOI
10.1080/08957950903549501
References
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