Application of IR ellipsometry to determination of the film thickness of a polytetrafluoroethylene sample modified in direct-current discharge

Published 2011 View Full Article

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Title
Application of IR ellipsometry to determination of the film thickness of a polytetrafluoroethylene sample modified in direct-current discharge
Authors
Keywords
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Journal
HIGH ENERGY CHEMISTRY
Volume 45, Issue 6, Pages 536-538
Publisher
Pleiades Publishing Ltd
Online
2011-11-08
DOI
10.1134/s0018143911060129
References
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