Yeh葉宗皇Chung-Huang
Taiwan National Central University
ORCID
Published in 2023
- Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method
- Authors: Chung-Huang Yeh, Jwu E Chen
- Journal: Journal of Circuits, Systems and Computers
ORCID
Published in 2023
- Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments
- Authors: Chung-Huang Yeh, Jwu E. Chen
- Journal: IEEE Design & Test
ORCID
Published in 2023
- Multiple Retest Systems for Screening High-Quality Chips
- Authors: Chung-Huang Yeh, Jwu E. Chen
- Journal: Journal of Electronic Testing
ORCID
Published in 2022
- Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect
- Authors: Chung-Huang Yeh, Jwu-E Chen
- Journal: Sensors
ORCID
Published in 2022
- Using Enhanced Test Systems Based on Digital IC Test Model for the Improvement of Test Yield
- Authors: Chung-Huang Yeh, Jwu-E Chen, Chia-Jui Chang, Tse-Chia Huang
- Journal: Electronics
ORCID
Published in 2021
- Unbalanced-Tests to the Improvement of Yield and Quality
- Authors: Chung-Huang Yeh, Jwu-E Chen
- Journal: Electronics
ORCID
Published in 2020
- Test yield and quality analysis models of chips
- Authors: Chung Huang Yeh, Jwu E Chen
- Journal: Journal of the Chinese Institute of Engineers
ORCID
Published in 2019
- Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements
- Authors: Chung-Huang Yeh, Jwu E. Chen
- Journal: Journal of Electronic Testing