Stability and migration of small copper clusters in amorphous dielectrics

Atomic origin of ultrafast resistance switching in nanoscale electrometallization cells

(2015) Nicolas Onofrio et al.   NATURE MATERIALS

Electrochemical dynamics of nanoscale metallic inclusions in dielectrics

(2014) Yuchao Yang et al.   Nature Communications

Narrow bandgap colloidal metal chalcogenide quantum dots: synthetic methods, heterostructures, assemblies, electronic and infrared optical properties

(2013) Stephen V. Kershaw et al.   CHEMICAL SOCIETY REVIEWS

Defect level distributions and atomic relaxations induced by charge trapping in amorphous silica

(2012) Nathan L. Anderson et al.   APPLIED PHYSICS LETTERS

Nucleation and growth phenomena in nanosized electrochemical systems for resistive switching memories

(2012) I. Valov et al.   JOURNAL OF SOLID STATE ELECTROCHEMISTRY

Atomically controlled electrochemical nucleation at superionic solid electrolyte surfaces

(2012) Ilia Valov et al.   NATURE MATERIALS

Ab initiostudy of Cu diffusion inα-cristobalite

(2012) M Zelený et al.   NEW JOURNAL OF PHYSICS

Effect of topological disorder on structural, mechanical, and electronic properties of amorphous silicon nitride: An atomistic study

(2012) Ravi Pramod Vedula et al.   PHYSICAL REVIEW B

Scaling limits of resistive memories

(2011) Victor V Zhirnov et al.   NANOTECHNOLOGY

Electrochemical metallization memories—fundamentals, applications, prospects

(2011) Ilia Valov et al.   NANOTECHNOLOGY

Electrochemical metallization memories—fundamentals, applications, prospects

(2011) Ilia Valov et al.   NANOTECHNOLOGY

Bulk and surface nucleation processes in Ag2S conductance switches

(2011) M. Morales-Masis et al.   PHYSICAL REVIEW B

First-Principles Investigation of Low EnergyE′Center Precursors in Amorphous Silica

(2011) Nathan L. Anderson et al.   PHYSICAL REVIEW LETTERS

Resistance switching of Cu/SiO2 memory cells studied under voltage and current-driven modes

(2010) Y. Bernard et al.   APPLIED PHYSICS LETTERS

Formation of copper islands on a native SiO2 surface at elevated temperatures

(2010) Jan Čechal et al.   APPLIED SURFACE SCIENCE

Back-end-of-line compatible Conductive Bridging RAM based on Cu and SiO2

(2010) Y. Bernard et al.   MICROELECTRONIC ENGINEERING

Nonvolatile Memory Concepts Based on Resistive Switching in Inorganic Materials

(2009) Thomas Mikolajick et al.   ADVANCED ENGINEERING MATERIALS

Electrode kinetics of Cu–SiO2-based resistive switching cells: Overcoming the voltage-time dilemma of electrochemical metallization memories

(2009) C. Schindler et al.   APPLIED PHYSICS LETTERS

Prospects of Colloidal Nanocrystals for Electronic and Optoelectronic Applications

(2009) Dmitri V. Talapin et al.   CHEMICAL REVIEWS

Influence of Cu diffusion conditions on the switching of Cu–SiO2-based resistive memory devices

(2009) S. Puthen Thermadam et al.   THIN SOLID FILMS

Copper ion diffusion in porous and nonporous SiO2-based dielectrics using bias thermal stress and thermal stress tests

(2007) I. Fisher et al.   THIN SOLID FILMS