Evidence for anisotropic dielectric properties of monoclinic hafnia using valence electron energy-loss spectroscopy in high-resolution transmission electron microscopy and ab initio time-dependent density-functional theory

Controlled oxygen vacancy induced p-type conductivity in HfO2−x thin films

(2011) Erwin Hildebrandt et al.   APPLIED PHYSICS LETTERS

Comparison of methods to determine bandgaps of ultrathin HfO2 films using spectroscopic ellipsometry

(2011) Ming Di et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Dynamic structure factor and dielectric function of silicon for finite momentum transfer: Inelastic x-ray scattering experiments andab initiocalculations

(2010) Hans-Christian Weissker et al.   PHYSICAL REVIEW B

Optical properties and bandgaps from low loss EELS: Pitfalls and solutions

(2008) M. Stöger-Pollach   MICRON

Determination of complex dielectric functions at HfO2/Si interface by using STEM-VEELS

(2008) Jucheol Park et al.   MICRON

The missing memristor found

(2008) Dmitri B. Strukov et al.   NATURE

Treating retardation effects in valence EELS spectra for Kramers–Kronig analysis

(2007) M. Stöger-Pollach et al.   ULTRAMICROSCOPY

The impact of surface and retardation losses on valence electron energy-loss spectroscopy

(2007) Rolf Erni et al.   ULTRAMICROSCOPY