Determination of complex dielectric functions at HfO2/Si interface by using STEM-VEELS

出版年份 2008 全文链接

标题

Determination of complex dielectric functions at HfO2/Si interface by using STEM-VEELS

作者

关键词

-

出版物

MICRON

Volume 40, Issue 3, Pages 365-369

出版商

Elsevier BV

发表日期

2008-10-22

DOI

10.1016/j.micron.2008.10.006

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