Investigation of the charge transport mechanism and subgap density of states in p-type Cu2O thin-film transistors

标题
Investigation of the charge transport mechanism and subgap density of states in p-type Cu2O thin-film transistors
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 102, Issue 8, Pages 082103
出版商
AIP Publishing
发表日期
2013-02-28
DOI
10.1063/1.4794061

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