Phonon and electron transport through Ge2Sb2Te5 films and interfaces bounded by metals

Phase and thickness dependent modulus of Ge2Sb2Te5 films down to 25 nm thickness

(2012) Yoonjin Won et al.   APPLIED PHYSICS LETTERS

Phase purity and the thermoelectric properties of Ge2Sb2Te5 films down to 25 nm thickness

(2012) Jaeho Lee et al.   JOURNAL OF APPLIED PHYSICS

Electrical and Thermal Conduction in Atomic Layer Deposition Nanobridges Down to 7 nm Thickness

(2012) Shingo Yoneoka et al.   NANO LETTERS

Experimental Validation of the Interfacial Form of the Wiedemann-Franz Law

(2012) R. B. Wilson et al.   PHYSICAL REVIEW LETTERS

Microthermal Stage for Electrothermal Characterization of Phase-Change Memory

(2011) Jaeho Lee et al.   IEEE ELECTRON DEVICE LETTERS

Thermal conductivity anisotropy and grain structure in Ge2Sb2Te5 films

(2011) Jaeho Lee et al.   JOURNAL OF APPLIED PHYSICS

Thickness dependence of the amorphous-cubic and cubic-hexagonal phase transition temperatures of GeSbTe thin films on silicon nitride

(2011) H.K. Peng et al.   THIN SOLID FILMS

Specific Contact Resistance of Phase Change Materials to Metal Electrodes

(2010) Deepu Roy et al.   IEEE ELECTRON DEVICE LETTERS

Thermal characterization of the SiO2-Ge2Sb2Te5 interface from room temperature up to 400°C

(2010) J.-L. Battaglia et al.   JOURNAL OF APPLIED PHYSICS

Phase Change Memory

(2010) H.-S. Philip Wong et al.   PROCEEDINGS OF THE IEEE

Low thermal conductivity in Ge2Sb2Te5–SiOx for phase change memory devices

(2009) David G. Cahill   APPLIED PHYSICS LETTERS

Thermal conductivities and phase transition temperatures of various phase-change materials measured by the 3ω method

(2009) W. P. Risk et al.   APPLIED PHYSICS LETTERS

Formation of Ge[sub 2]Sb[sub 2]Te[sub 5]–TiO[sub x] Nanostructures for Phase Change Random Access Memory Applications

(2009) Dongbok Lee et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Thermal Boundary Resistance Measurements for Phase-Change Memory Devices

(2009) J.P. Reifenberg et al.   IEEE ELECTRON DEVICE LETTERS

Thermal and Electrical Characterization of Materials for Phase-Change Memory Cells†

(2009) Roberto Fallica et al.   JOURNAL OF CHEMICAL AND ENGINEERING DATA

Toward the Ultimate Limit of Phase Change in Ge2Sb2Te5

(2009) R. E. Simpson et al.   NANO LETTERS

Nonradiative recombination in strongly interacting silicon nanocrystals embedded in amorphous silicon-oxide films

(2009) Jeremy A. Rowlette et al.   PHYSICAL REVIEW B

Theoretical study of the elastic properties of titanium nitride

(2009) Dong CHEN et al.   Acta Metallurgica Sinica-English Letters

Specific contact resistance and carrier tunneling properties of the silver metal/porous silicon/p-Si ohmic contact structure

(2008) P.N. Vinod   JOURNAL OF ALLOYS AND COMPOUNDS

Crystallization properties of ultrathin phase change films

(2008) Simone Raoux et al.   JOURNAL OF APPLIED PHYSICS

In situ 3ω techniques for measuring thermal conductivity of phase-change materials

(2008) W. P. Risk et al.   REVIEW OF SCIENTIFIC INSTRUMENTS