Phase purity and the thermoelectric properties of Ge2Sb2Te5 films down to 25 nm thickness

标题
Phase purity and the thermoelectric properties of Ge2Sb2Te5 films down to 25 nm thickness
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 112, Issue 1, Pages 014902
出版商
AIP Publishing
发表日期
2012-07-03
DOI
10.1063/1.4731252

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