Transmission electron microscopy study of degradation in transparent indium tin oxide/Ag/indium tin oxide multilayer films

标题
Transmission electron microscopy study of degradation in transparent indium tin oxide/Ag/indium tin oxide multilayer films
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 103, Issue 1, Pages 011902
出版商
AIP Publishing
发表日期
2013-07-03
DOI
10.1063/1.4812815

向作者/读者发起求助以获取更多资源

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started