Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains

标题
Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 94, Issue 16, Pages 162903
出版商
AIP Publishing
发表日期
2009-04-23
DOI
10.1063/1.3105942

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