Performance enhancement of n-channel inversion type InxGa1−xAs metal-oxide-semiconductor field effect transistor using ex situ deposited thin amorphous silicon layer

标题
Performance enhancement of n-channel inversion type InxGa1−xAs metal-oxide-semiconductor field effect transistor using ex situ deposited thin amorphous silicon layer
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 93, Issue 12, Pages 122109
出版商
AIP Publishing
发表日期
2008-09-27
DOI
10.1063/1.2991340

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