Tungsten Oxide as a Gate Dielectric for Highly Transparent and Temperature-Stable Zinc-Oxide-Based Thin-Film Transistors

标题
Tungsten Oxide as a Gate Dielectric for Highly Transparent and Temperature-Stable Zinc-Oxide-Based Thin-Film Transistors
作者
关键词
-
出版物
ADVANCED MATERIALS
Volume 23, Issue 45, Pages 5383-5386
出版商
Wiley
发表日期
2011-10-14
DOI
10.1002/adma.201103087

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