Genome-wide association mapping in bread wheat subjected to independent and combined high temperature and drought stress

标题
Genome-wide association mapping in bread wheat subjected to independent and combined high temperature and drought stress
作者
关键词
Thermal stresses, Wheat, Plant resistance to abiotic stress, Genome-wide association studies, Leaves, Quantitative trait loci, Genomics, Phenotypes
出版物
PLoS One
Volume 13, Issue 6, Pages e0199121
出版商
Public Library of Science (PLoS)
发表日期
2018-06-28
DOI
10.1371/journal.pone.0199121

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