Genome-wide association study for grain yield and related traits in elite wheat varieties and advanced lines using SNP markers

标题
Genome-wide association study for grain yield and related traits in elite wheat varieties and advanced lines using SNP markers
作者
关键词
Wheat, Gene mapping, Molecular genetics, Genome-wide association studies, Phenotypes, Quantitative trait loci, Genetic loci, Population genetics
出版物
PLoS One
Volume 12, Issue 11, Pages e0188662
出版商
Public Library of Science (PLoS)
发表日期
2017-11-28
DOI
10.1371/journal.pone.0188662

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