Study of the interface stability of the metal (Mo, Ni, Pd)/HfO2/AlN/InGaAs MOS devices
出版年份 2017 全文链接
标题
Study of the interface stability of the metal (Mo, Ni, Pd)/HfO2/AlN/InGaAs MOS devices
作者
关键词
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出版物
AIP Advances
Volume 7, Issue 8, Pages 085208
出版商
AIP Publishing
发表日期
2017-08-09
DOI
10.1063/1.4986147
参考文献
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