A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation
出版年份 2017 全文链接
标题
A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation
作者
关键词
-
出版物
MICROSCOPY AND MICROANALYSIS
Volume 23, Issue 04, Pages 782-793
出版商
Cambridge University Press (CUP)
发表日期
2017-06-19
DOI
10.1017/s1431927617000514
参考文献
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