Sample preparation for atomic-resolution STEM at low voltages by FIB

标题
Sample preparation for atomic-resolution STEM at low voltages by FIB
作者
关键词
-
出版物
ULTRAMICROSCOPY
Volume 114, Issue -, Pages 62-71
出版商
Elsevier BV
发表日期
2012-01-19
DOI
10.1016/j.ultramic.2012.01.005

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