Quantitative Trait Loci Associated with Phenological Development, Low-Temperature Tolerance, Grain Quality, and Agronomic Characters in Wheat (Triticum aestivum L.)

标题
Quantitative Trait Loci Associated with Phenological Development, Low-Temperature Tolerance, Grain Quality, and Agronomic Characters in Wheat (Triticum aestivum L.)
作者
关键词
Quantitative trait loci, Wheat, Leaves, Chromosome mapping, Vernalization, Habits, Gene mapping, Cereal crops
出版物
PLoS One
Volume 11, Issue 3, Pages e0152185
出版商
Public Library of Science (PLoS)
发表日期
2016-03-29
DOI
10.1371/journal.pone.0152185

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