A novel in-situ approach to monitor the variations in the on-resistance of power transistors during switching operation

标题
A novel in-situ approach to monitor the variations in the on-resistance of power transistors during switching operation
作者
关键词
-
出版物
MICROELECTRONICS RELIABILITY
Volume 150, Issue -, Pages 115199
出版商
Elsevier BV
发表日期
2023-10-02
DOI
10.1016/j.microrel.2023.115199

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