Experimental and Numerical Evaluation of RON Degradation in GaN HEMTs During Pulse-Mode Operation

标题
Experimental and Numerical Evaluation of RON Degradation in GaN HEMTs During Pulse-Mode Operation
作者
关键词
-
出版物
IEEE Journal of the Electron Devices Society
Volume 5, Issue 6, Pages 491-495
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2017-10-11
DOI
10.1109/jeds.2017.2754859

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