标题
CO2 Cluster Ion Beam, an Alternative Projectile for Secondary Ion Mass Spectrometry
作者
关键词
Secondary ion mass spectrometry (SIMS), Gas cluster ion beams (GCIB), CO<sub>2</sub> cluster
出版物
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
Volume 27, Issue 9, Pages 1476-1482
出版商
Springer Nature
发表日期
2016-06-20
DOI
10.1007/s13361-016-1423-z
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Reduce the matrix effect in biological tissue imaging using dynamic reactive ionization and gas cluster ion beams
- (2016) Hua Tian et al. Biointerphases
- Reduce the matrix effect in biological tissue imaging using dynamic reactive ionization and gas cluster ion beams
- (2016) Hua Tian et al. Biointerphases
- Enhancing Ion Yields in Time-of-Flight-Secondary Ion Mass Spectrometry: A Comparative Study of Argon and Water Cluster Primary Beams
- (2015) Sadia Sheraz née Rabbani et al. ANALYTICAL CHEMISTRY
- High energy gas cluster ions for organic and biological analysis by time-of-flight secondary ion mass spectrometry
- (2015) Tina B. Angerer et al. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
- Molecular Depth Profiling with Argon Gas Cluster Ion Beams
- (2015) Kan Shen et al. Journal of Physical Chemistry C
- Dynamic Reactive Ionization with Cluster Secondary Ion Mass Spectrometry
- (2015) Hua Tian et al. JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
- Mass spectrometric imaging of brain tissue by time-of-flight secondary ion mass spectrometry - How do polyatomic primary beams C60+, Ar2000+, water-doped Ar2000+and (H2O)6000+compare?
- (2015) Irma Berrueta Razo et al. RAPID COMMUNICATIONS IN MASS SPECTROMETRY
- Novel SIMS system with focused massive cluster ion source for mass imaging spectrometry with high lateral resolution
- (2014) Jiro Matsuo et al. Applied Physics Express
- Universal Equation for Argon Cluster Size-Dependence of Secondary Ion Spectra in SIMS of Organic Materials
- (2014) Martin P. Seah et al. Journal of Physical Chemistry C
- Molecular imaging of biological tissue using gas cluster ions
- (2014) Hua Tian et al. SURFACE AND INTERFACE ANALYSIS
- Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers
- (2013) N. Wehbe et al. ANALYTICAL AND BIOANALYTICAL CHEMISTRY
- Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams
- (2013) Sadia Sheraz née Rabbani et al. ANALYTICAL CHEMISTRY
- A mixed cluster ion beam to enhance the ionization efficiency in molecular secondary ion mass spectrometry
- (2013) Andreas Wucher et al. RAPID COMMUNICATIONS IN MASS SPECTROMETRY
- Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
- (2012) Alexander G. Shard et al. ANALYTICAL CHEMISTRY
- TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+
- (2011) Sadia Rabbani et al. ANALYTICAL CHEMISTRY
- ReaxFF-lg: Correction of the ReaxFF Reactive Force Field for London Dispersion, with Applications to the Equations of State for Energetic Materials
- (2011) Lianchi Liu et al. JOURNAL OF PHYSICAL CHEMISTRY A
- Three-dimensional mass spectral imaging of HeLa-M cells - sample preparation, data interpretation and visualisation
- (2011) John S. Fletcher et al. RAPID COMMUNICATIONS IN MASS SPECTROMETRY
- Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions
- (2010) C. Lu et al. SURFACE AND INTERFACE ANALYSIS
- A new time-of-flight SIMS instrument for 3D imaging and analysis
- (2010) Rowland Hill et al. SURFACE AND INTERFACE ANALYSIS
- Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions
- (2009) J. L. S. Lee et al. ANALYTICAL CHEMISTRY
- Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams
- (2009) Satoshi Ninomiya et al. RAPID COMMUNICATIONS IN MASS SPECTROMETRY
- A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions
- (2008) Satoshi Ninomiya et al. APPLIED SURFACE SCIENCE
- Molecular depth profiling of trehalose using a C60 cluster ion beam
- (2008) Andreas Wucher et al. APPLIED SURFACE SCIENCE
- Gas Cluster Ion Beam Equipment and Applications for Surface Processing
- (2008) Noriaki Toyoda et al. IEEE TRANSACTIONS ON PLASMA SCIENCE
- Computational view of surface based organic mass spectrometry
- (2008) Barbara J. Garrison et al. MASS SPECTROMETRY REVIEWS
Add your recorded webinar
Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.
Upload NowBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started