Site-specific preparation of plan-view samples with large field of view for atomic resolution STEM and TEM studies of rapidly solidified multi-phase Al Cu thin films
出版年份 2022 全文链接
标题
Site-specific preparation of plan-view samples with large field of view for atomic resolution STEM and TEM studies of rapidly solidified multi-phase Al Cu thin films
作者
关键词
-
出版物
MATERIALS CHARACTERIZATION
Volume 189, Issue -, Pages 111943
出版商
Elsevier BV
发表日期
2022-05-07
DOI
10.1016/j.matchar.2022.111943
参考文献
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