Site-specific preparation of plan-view samples with large field of view for atomic resolution STEM and TEM studies of rapidly solidified multi-phase Al Cu thin films

标题
Site-specific preparation of plan-view samples with large field of view for atomic resolution STEM and TEM studies of rapidly solidified multi-phase Al Cu thin films
作者
关键词
-
出版物
MATERIALS CHARACTERIZATION
Volume 189, Issue -, Pages 111943
出版商
Elsevier BV
发表日期
2022-05-07
DOI
10.1016/j.matchar.2022.111943

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now