Correlation between mobility collapse and carbon impurities in Si-doped GaN grown by low pressure metalorganic chemical vapor deposition

标题
Correlation between mobility collapse and carbon impurities in Si-doped GaN grown by low pressure metalorganic chemical vapor deposition
作者
关键词
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出版物
JOURNAL OF APPLIED PHYSICS
Volume 120, Issue 10, Pages 105701
出版商
AIP Publishing
发表日期
2016-09-09
DOI
10.1063/1.4962017

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