Extremely Low On-Resistance and High Breakdown Voltage Observed in Vertical GaN Schottky Barrier Diodes with High-Mobility Drift Layers on Low-Dislocation-Density GaN Substrates

标题
Extremely Low On-Resistance and High Breakdown Voltage Observed in Vertical GaN Schottky Barrier Diodes with High-Mobility Drift Layers on Low-Dislocation-Density GaN Substrates
作者
关键词
-
出版物
Applied Physics Express
Volume 3, Issue 8, Pages 081001
出版商
IOP Publishing
发表日期
2010-07-16
DOI
10.1143/apex.3.081001

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