Correlation between the macroscopic ferroelectric material properties of Si:HfO2and the statistics of 28 nm FeFET memory arrays

Ferroelectricity in undoped hafnium oxide

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The origin of ferroelectricity in Hf1−xZrxO2: A computational investigation and a surface energy model

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Electric Field Cycling Behavior of Ferroelectric Hafnium Oxide

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A 130.7-$\hbox{mm}^{2}$ 2-Layer 32-Gb ReRAM Memory Device in 24-nm Technology

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A Fully Functional 64 Mb DDR3 ST-MRAM Built on 90 nm CMOS Technology

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Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin films

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Ferroelectricity in hafnium oxide thin films

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TaN metal gate damage during high-k (Al2O3) high-temperature etch

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