Highly Sensitive Evaluation of Density of States in Molecular Semiconductors by Photoelectron Yield Spectroscopy in Air

标题
Highly Sensitive Evaluation of Density of States in Molecular Semiconductors by Photoelectron Yield Spectroscopy in Air
作者
关键词
-
出版物
ACS Applied Materials & Interfaces
Volume 13, Issue 24, Pages 28574-28582
出版商
American Chemical Society (ACS)
发表日期
2021-06-11
DOI
10.1021/acsami.1c05686

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