Total photoelectron yield spectroscopy of energy distribution of electronic states density at GaN surface and SiO2/GaN interface

标题
Total photoelectron yield spectroscopy of energy distribution of electronic states density at GaN surface and SiO2/GaN interface
作者
关键词
-
出版物
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 57, Issue 6S3, Pages 06KA08
出版商
Japan Society of Applied Physics
发表日期
2018-05-23
DOI
10.7567/jjap.57.06ka08

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