Comparing Xe + pFIB and Ga + FIB for TEM sample preparation of Al alloys: Minimising FIB‐induced artefacts
出版年份 2020 全文链接
标题
Comparing Xe
+
pFIB and Ga
+
FIB for TEM sample preparation of Al alloys: Minimising FIB‐induced artefacts
作者
关键词
-
出版物
JOURNAL OF MICROSCOPY
Volume -, Issue -, Pages -
出版商
Wiley
发表日期
2020-11-20
DOI
10.1111/jmi.12983
参考文献
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