TEM Specimen Preparation with Plasma FIB Xe+ Ions

标题
TEM Specimen Preparation with Plasma FIB Xe+ Ions
作者
关键词
-
出版物
MICROSCOPY AND MICROANALYSIS
Volume 17, Issue S2, Pages 646-647
出版商
Cambridge University Press (CUP)
发表日期
2011-10-08
DOI
10.1017/s1431927611004107

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