Investigation of resistive switching and transport mechanisms of Al2O3/TiO2−x memristors under cryogenic conditions (1.5 K)

标题
Investigation of resistive switching and transport mechanisms of Al2O3/TiO2−x memristors under cryogenic conditions (1.5 K)
作者
关键词
-
出版物
AIP Advances
Volume 10, Issue 2, Pages 025305
出版商
AIP Publishing
发表日期
2020-02-03
DOI
10.1063/1.5140994

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