On-Wafer S-Parameter Measurements in the 325–508 GHz Band

标题
On-Wafer S-Parameter Measurements in the 325–508 GHz Band
作者
关键词
-
出版物
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2012-02-23
DOI
10.1109/tthz.2011.2182369

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