标题
Characterizing the structure of topological insulator thin films
作者
关键词
-
出版物
APL Materials
Volume 3, Issue 8, Pages 083303
出版商
AIP Publishing
发表日期
2015-07-09
DOI
10.1063/1.4926455
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Simultaneous Electrical-Field-Effect Modulation of Both Top and Bottom Dirac Surface States of Epitaxial Thin Films of Three-Dimensional Topological Insulators
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