High-Quality Thin SiO2Films Grown by Atomic Layer Deposition Using Tris(dimethylamino)silane (TDMAS) and Ozone

标题
High-Quality Thin SiO2Films Grown by Atomic Layer Deposition Using Tris(dimethylamino)silane (TDMAS) and Ozone
作者
关键词
-
出版物
ECS Journal of Solid State Science and Technology
Volume 2, Issue 11, Pages N228-N236
出版商
The Electrochemical Society
发表日期
2013-10-16
DOI
10.1149/2.001312jss

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